TÜRKÇE
ENGLISH
Information
| Unit | FACULTY OF SCIENCE AND LETTERS |
| CHEMISTRY PR. | |
| Code | KM336 |
| Name | Instrumental Analysis Laboratory |
| Term | 2020-2021 Academic Year |
| Semester | 6. Semester |
| Duration (T+A) | 0-4 (T-A) (17 Week) |
| ECTS | 2 ECTS |
| National Credit | 2 National Credit |
| Teaching Language | Türkçe |
| Level | Lisans Dersi |
| Type | Normal |
| Label | C Compulsory |
| Mode of study | Yüz Yüze Öğretim |
| Catalog Information Coordinator | Prof. Dr. BİLGEHAN GÜZEL |
| Course Instructor |
Prof. Dr. BİLGEHAN GÜZEL
(Bahar)
(A Group)
(Ins. in Charge)
|
Course Goal / Objective
The aim of this laboratory is teaching and application of enstruments
Course Content
Analysis of Uv-Vis, IR, AAS, GC
Course Precondition
Resources
Notes
Course Learning Outcomes
| Order | Course Learning Outcomes |
|---|---|
| LO01 | using spectroscopic instruments |
| LO02 | Differences of instruments parts |
| LO03 | Points to consider when using devices |
| LO04 | Learn to evaluate data |
| LO05 | Learn what should be considered in method selection in analysis |
Relation with Program Learning Outcome
| Order | Type | Program Learning Outcomes | Level |
|---|
Week Plan
| Week | Topic | Preparation | Methods |
|---|---|---|---|
| 1 | Introducing Uv-vis device | Presentation of device parts | |
| 2 | Application of Uv-Vis | Sample preparation for UV-vis | |
| 3 | Introducing IR device | Presentation of device parts | |
| 4 | Application of IR | Sample preparation for IR | |
| 5 | Introducing AAS device | Presentation of device parts | |
| 6 | Application of AAS | Sample preparation for AAS | |
| 7 | Introducing magnetic suseptiblty device | Presentation of device parts | |
| 8 | Mid-Term Exam | An overview | |
| 9 | Make-up experiment | Prepare for related experiment | |
| 10 | Introduction of chromatographic analysis | Presentation of device parts | |
| 11 | Introducing GC device | Presentation of device parts | |
| 12 | Application of GC | Sample preparation for GC | |
| 13 | Introducing GC-MS device | Presentation of device parts | |
| 14 | Application of GC-MS | Sample preparation for GC-MS | |
| 15 | Introducing SEM device | Presentation of device parts | |
| 16 | Term Exams | An overview | |
| 17 | Term Exams | An overview |
Assessment (Exam) Methods and Criteria
| Assessment Type | Midterm / Year Impact | End of Term / End of Year Impact |
|---|---|---|
| 1. Midterm Exam | 100 | 40 |
| General Assessment | ||
| Midterm / Year Total | 100 | 40 |
| 1. Final Exam | - | 60 |
| Grand Total | - | 100 |
Student Workload - ECTS
| Works | Number | Time (Hour) | Workload (Hour) |
|---|---|---|---|
| Course Related Works | |||
| Class Time (Exam weeks are excluded) | 14 | 1 | 14 |
| Out of Class Study (Preliminary Work, Practice) | 14 | 2 | 28 |
| Assesment Related Works | |||
| Homeworks, Projects, Others | 0 | 0 | 0 |
| Mid-term Exams (Written, Oral, etc.) | 1 | 4 | 4 |
| Final Exam | 1 | 12 | 12 |
| Total Workload (Hour) | 58 | ||
| Total Workload / 25 (h) | 2,32 | ||
| ECTS | 2 ECTS | ||